Process/Manufacturing Capabilities

We operate in a 20,000 sqft. Class 100 cleanroom with full MEMS manufacturing capability for 150mm silicon, SOI, or glass wafers. Below are our standard process and manufacturing capabilities.  If you don't see a process or capability you are looking for, contact us to see how we may be able to help.

Lithography

  • Steppers
  • 1x Aligners
  • FS/BS Align & Expose (contact, proximity)
  • Minimum CD = 1um
  • Minimum Overlay < 1um
  • Positive and Negative resist capability
  • Polyimide coat/cure

Silicon Micromachining/RIE

  • KOH Bulk Silicon wet etching
  • Precision DRIE etching, Bosch process (SOI capable)
  • Nitride
  • Oxide
  • Polysilicon
  • O2 Plasma Strip/Clean

Metallization

  • PVD Sputter (MRC, down and side sputter, DC/RF)
  • E-Beam evaporator
  • Metals: Au, NiFe (Permalloy), Al, Ti, TiN, TiW, Pt, Pd, CrSi
  • Electroplating: Au, Cu, Ni
  • TMP (Through-mask plating) and shadow mask processes

Thin Films/Diffusion

  • PECVD Films: Nitride, Oxide, Oxynitride
  • LPCVD Films: Nitride, Polysilicon, TEOS, POCL3 doped polysilicon
  • Oxidation: Wet & Dry Thermal oxidation
  • High Temperature Anneal

Wet Etch/Cleans

  • Standard Cleans: SC1, SC2, Pirhana, BOE, Solvent Strip
  • Wet Metal Etch: Al, Au (KI+I & Aqua Regia), Cr, Pd, Pt, Ti/TiW
  • Other Wet Etch: HF Release, Nitric, rinse/dry

Wafer Bonding

  • Bond alignment < 5um (front to back)
  • Bond pressure up to 6 bar, vacuum to 1 Torr, Temp up to 500C
  • IR bond inspection
  • Anodic bonding
  • Low temp Silicon/Oxide Fusion Bonding
  • AuSi Eutectic Bonding
  • Glass Frit Bonding

Backgrind/Polish/Dice

  • Backgrind (down to 250um)
  • Silicon polish/CMP
  • Wafer dicing

Metrology/Test Probe

  • Automated wafer probing/parametric test
  • Thin Film Measurement (Nanospec)
  • Microscope Inspection/Automated Pattern Inspection
  • Particle Inspection (Tencor)
  • Step Height Profilometer
  • 4-point probe (metal thickness)
  • Stress guage (warp/bow)

Manufacturing Execution System (MES)

  • Automated WIP tracking
  • Full manufacturing traceability
  • Inline and probe data collection & archival